1 August 1991 Optical techniques for microwave monolithic circuit characterization
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Abstract
Based on the electro-optic (EO) sampling approach, a technique has been developed which offers high detection sensitivity for the measurement of two-dimensional electric field distribution in a GaAs microstrip line circuit. The interference effect in the EO sampling process was also investigated using this technique. The study resulted in a better understanding of the limitations of EO sampling. It is shown that correct use of the pulse width of the laser beam with respect to GaAs substrate thickness can lead to an accurate and consistent optical characterization of monolithic microwave integrated circuits (MMICs).
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hing-Loi A. Hung, Ming-Guang Li, Chi Hsiang Lee, "Optical techniques for microwave monolithic circuit characterization", Proc. SPIE 1476, Optical Technology for Microwave Applications V, (1 August 1991); doi: 10.1117/12.46258; https://doi.org/10.1117/12.46258
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