1 August 1991 Anodic oxides on HgZnTe
Author Affiliations +
The formation of anodic oxides on HgZnTe has been studied and characterized by XPS technique. The physical properties of anodized p-type layers have been investigated by the differential Hall effect, photoconductivity, and photoluminescence measurements. It was found that the tendency to form surface inversion layers on HgZnTe by anodization is considerably lower than that for HgCdTe. There is a considerable increase in effective lifetime values and in photoluminescence intensities. In addition, significant differences between the voltametric analysis curves of HgZnTe and HgCdTe were observed. The results are discussed in view of the bonding characteristics of the two materials.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Eger, David Eger, Alex Zigelman, Alex Zigelman, } "Anodic oxides on HgZnTe", Proc. SPIE 1484, Growth and Characterization of Materials for Infrared Detectors and Nonlinear Optical Switches, (1 August 1991); doi: 10.1117/12.46506; https://doi.org/10.1117/12.46506

Back to Top