New thermistor material for thermistor bolometer: material preparation and characterization

P. Umadevi; C. L. Nagendra; G. K. M. Thutupalli; K. Mahadevan; G. Yadgiri

doi:10.1117/12.46535

1 September 1991 New thermistor material for thermistor bolometer: material preparation and characterization

P. Umadevi, C. L. Nagendra, G. K. M. Thutupalli, K. Mahadevan, G. Yadgiri

Proceedings Volume 1485, Reflective and Refractive Optical Materials for Earth and Space Applications; (1991) https://doi.org/10.1117/12.46535
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

Structural, electrical and infrared optical properties of screen printed vanadium oxide thick films have been studied for the first time. It is seen that the original starting material, in the form of V2O3, undergoes a global transformation to its next higher oxide V2O5 during firing. This has been confirmed through DTA and XRD. The crystalline morphology of the transformed V2O5 seems to improve as a function of firing temperature in the range of 400-600 C. The associated screen printed resistors have temperature coefficient of resistance in the range of -37,000 to -17,000 ppm per K over a temperature range of -65 to +155 C and thermistor constant equal to 2000 K, which are independent of firing temperature. It is observed that both electrical resistivity and infrared emissivity decreases with increase of firing temperature, attaining values of 1.12 x 100 ohm cm for electrical resistivity and 82 percent for IR emissivity at a 550 C firing.

Citation Download Citation

P. Umadevi, C. L. Nagendra, G. K. M. Thutupalli, K. Mahadevan, and G. Yadgiri "New thermistor material for thermistor bolometer: material preparation and characterization", Proc. SPIE 1485, Reflective and Refractive Optical Materials for Earth and Space Applications, (1 September 1991); https://doi.org/10.1117/12.46535

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