1 September 1991 SPRITE detector characterization through impulse response testing
Author Affiliations +
An impulse response test and data evaluation method for characterizing a SPRITE detector capable of determining carrier lifetime, ambipolar mobility, carrier drift velocity variation, and detector limits is presented. The data obtained with the method can be used to optimize imaging system performance or to tailor future detectors from the same material lot. Results for a 3-5 micron detector bar, 650 microns long with a 62.5 microns horn geometry readout are reported.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barry K. Anderson, Glenn D. Boreman, Kenneth J. Barnard, Allen E. Plogstedt, "SPRITE detector characterization through impulse response testing", Proc. SPIE 1488, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing II, (1 September 1991); doi: 10.1117/12.45822; https://doi.org/10.1117/12.45822


Infrared focal plane array modeling
Proceedings of SPIE (October 01 1990)
Sine wave measurements of SPRITE detector MTF
Proceedings of SPIE (September 01 1991)
Effects of pixel area versus number of pixels on FPA...
Proceedings of SPIE (October 01 1990)
Computer Modeling As A Tool For Optical Systems' Specifications
Proceedings of SPIE (September 07 1979)
Spatial frequency performance of SPRITE detectors
Proceedings of SPIE (October 01 1990)

Back to Top