Reflectance stability analysis of Spectralon diffuse calibration panels

Carol J. Bruegge; Albert E. Stiegman; Daniel R. Coulter; Robert R. Hale; David J. Diner; Arthur W. Springsteen

doi:10.1117/12.46691

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1 August 1991 Reflectance stability analysis of Spectralon diffuse calibration panels

Carol J. Bruegge, Albert E. Stiegman, Daniel R. Coulter, Robert R. Hale, David J. Diner, Arthur W. Springsteen

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Proceedings Volume 1493, Calibration of Passive Remote Observing Optical and Microwave Instrumentation; (1991) https://doi.org/10.1117/12.46691
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

The Multi-angle Imaging SpectroRadiometer (MISR) plans to use deployable diffuse reflectance panels to provide periodic radiometric calibrations of its nine cameras while in-flight. Near-Lambertian reflectance characteristics are desirable to facilitate flat-field camera intercomparisons. Also required is panel spatial and spectral uniformity, and stability with time. Spectralon, a commercially available polytetrafluoroethylene (PTFE) compound, has been baselined in the MISR design. To assess the suitability of this material, a series of degradation tests were planned and implemented. These included UV vacuum exposure and proton bombardment tests which simulated the exposure levels to be encountered during the mission life. Proton levels are now considered too low to be of concern, but UV vacuum tests demonstrate sensitivity to material contamination. Material investigations have concluded that hydrocarbons are present in the bulk of the material, and that plastic packaging materials can introduce additional surface-layer contamination. It is found however, that these unwanted elements can be eliminated through vacuum pumping at elevated temperatures. Exposure to a UV source, while in vacuum, is again planned for a set of targets which have been vacuum baked. This will assess the stability of the pure PTFE form.

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Carol J. Bruegge, Albert E. Stiegman, Daniel R. Coulter, Robert R. Hale, David J. Diner, and Arthur W. Springsteen "Reflectance stability analysis of Spectralon diffuse calibration panels", Proc. SPIE 1493, Calibration of Passive Remote Observing Optical and Microwave Instrumentation, (1 August 1991); https://doi.org/10.1117/12.46691

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