1 July 1991 Scanning optical microscopy: a powerful tool in optical recording
Author Affiliations +
Proceedings Volume 1499, Optical Data Storage '91; (1991) https://doi.org/10.1117/12.45946
Event: Optical Data Storage, 1991, Colorado Springs, CO, United States
Abstract
A Scanning Optical Microscope (SOM) provides valuable information on the physical and optical properties of an optical recording system. In particular, alternative detection modes such as Differential Phase Contrast detection provide a means of separating the phase and amplitude parts of the local reflectivity, and the SOM is thereby able to distinguish some of the processes involved in optical recording. In this paper we describe how a SOM can be used in optical recording research and development, and give examples of its application.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James H. Coombs, James H. Coombs, A. H. M. Holtslag, A. H. M. Holtslag, } "Scanning optical microscopy: a powerful tool in optical recording", Proc. SPIE 1499, Optical Data Storage '91, (1 July 1991); doi: 10.1117/12.45946; https://doi.org/10.1117/12.45946
PROCEEDINGS
15 PAGES


SHARE
RELATED CONTENT

Optical storage using organic compounds as recording materials
Proceedings of SPIE (September 03 1996)
Focus Error Detection In Optical Data Storage Systems
Proceedings of SPIE (February 12 1980)
Dual-level optical disks
Proceedings of SPIE (June 28 1999)

Back to Top