A Scanning Optical Microscope (SOM) provides valuable information on the physical and optical properties of an optical recording system. In particular, alternative detection modes such as Differential Phase Contrast detection provide a means of separating the phase and amplitude parts of the local reflectivity, and the SOM is thereby able to distinguish some of the processes involved in optical recording. In this paper we describe how a SOM can be used in optical recording research and development, and give examples of its application.
James H. Coombs,
A. H. M. Holtslag,
"Scanning optical microscopy: a powerful tool in optical recording", Proc. SPIE 1499, Optical Data Storage '91, (1 July 1991); doi: 10.1117/12.45946; https://doi.org/10.1117/12.45946