High-Speed Communication Detector Characterization By Bit Error Rate Measurements

Samuel I. Green

doi:10.1117/12.956697

21 December 1978 High-Speed Communication Detector Characterization By Bit Error Rate Measurements

Samuel I. Green

Proceedings Volume 0150, Laser and Fiber Optics Communications; (1978) https://doi.org/10.1117/12.956697
Event: 22nd Annual Technical Symposium, 1978, San Diego, United States

Abstract

Performance data taken on several candidate high data rate laser communications photo-detectors is presented. Measurements of bit error rate versus signal level were made in both a 1064 nm system at 400 Mbps and a 532 nm system at 500 Mbps. RCA silicon avalanche photodiodes are superior at 1064 nm, but the Rockwell hybrid 3-5 avalanche photodiode preamplifiers offer potentially superior performance. Varian dynamic crossed field photo-multipliers are superior at 532 nm, however the RCA silicon avalanche photodiode is a close contender.

Citation Download Citation

Samuel I. Green "High-Speed Communication Detector Characterization By Bit Error Rate Measurements", Proc. SPIE 0150, Laser and Fiber Optics Communications, (21 December 1978); https://doi.org/10.1117/12.956697

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