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1 September 1991 Holographic testing canal of adaptive optical systems
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Abstract
In this work the problems of the design of the testing canal of adaptive optical system on the basis of the hologram optical element (HOE) coated on the active element is considered. The paraxial analysis of the HOE recording and the test ing canal working are presented. As wel 1 as the analys is of holographic testing canal working with respect up to the fourth-order wave aberrat ions . On the bas is of this analysis the tolerances for the hologram construction optical parameters are determined. The results of modeling of the aberration being arisen both in the main canal and in the testing one for the various deformations and the displacements of the active surface are presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mikhail A. Gan and Igor Stanislavo Potyemin "Holographic testing canal of adaptive optical systems", Proc. SPIE 1507, Holographic Optics III: Principles and Applications, (1 September 1991); https://doi.org/10.1117/12.47081
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