Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films

Ansheng Liu; Ole Keller

doi:10.1117/12.47167

1 September 1991 Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films

Ansheng Liu, Ole Keller

Proceedings Volume 1512, Infrared and Optoelectronic Materials and Devices; (1991) https://doi.org/10.1117/12.47167
Event: ECO4 (The Hague '91), 1991, The Hague, Netherlands

Abstract

The optical anisotropy of GdBa2Cu3O7-x epitaxial films has been experimentally investigated by use of ellipsometry and polarized reflectance measurements. The individual principal components of the dielectric tensor of this new high-Tc compound are derived from ellipsometric measurements performed in the visible and infrared frequency regions. Our results show that this compound is highly anisotropic in the near infrared region, and that it exhibits strongly free-electron-like behavior in the c-axis direction at optical frequencies.

Citation Download Citation

Ansheng Liu and Ole Keller "Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films", Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); https://doi.org/10.1117/12.47167

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