1 September 1991 Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films
Author Affiliations +
Abstract
The optical anisotropy of GdBa2Cu3O7-x epitaxial films has been experimentally investigated by use of ellipsometry and polarized reflectance measurements. The individual principal components of the dielectric tensor of this new high-Tc compound are derived from ellipsometric measurements performed in the visible and infrared frequency regions. Our results show that this compound is highly anisotropic in the near infrared region, and that it exhibits strongly free-electron-like behavior in the c-axis direction at optical frequencies.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ansheng Liu, Ansheng Liu, Ole Keller, Ole Keller, } "Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films", Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); doi: 10.1117/12.47167; https://doi.org/10.1117/12.47167
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT


Back to Top