1 December 1990 Checking the surface resistance of ordinary EMI-shielding foil at millimeter-wave frequencies using a simple quasioptical technique
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151413 (1990) https://doi.org/10.1117/12.2301449
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
For a variety of electromagnetic shielding applications mass-produced absorbing foil is available of which only D.C. surface resistance data are blown. Using a simple quasioptical arrangement die data at mm-wave frequencies are derived from reflection minima and the approximately known dielectric properties of the basis material. The range of validity of the measurement is discussed. Data for carbon- filled polycarbonate and indium-tin-oxide-coated PET foil are given.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Udo B. Unrau, Udo B. Unrau, } "Checking the surface resistance of ordinary EMI-shielding foil at millimeter-wave frequencies using a simple quasioptical technique", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151413 (1 December 1990); doi: 10.1117/12.2301449; https://doi.org/10.1117/12.2301449
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