Paper
1 December 1990 Design and fabrication of narrow band radar absorbing materials at terahertz frequencies
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151426 (1990) https://doi.org/10.1117/12.2301488
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The technique of tailoring the complex refractive index of an artificial dielectric material has been developed at the University of Lowell Research Foundation (ULRF). Low reflection coatings, generally referred to as Dallenbach layers, have been designed for metal substrates using the artificial dielectric. The method of characterizing materials for the purpose of tailoring their dielectric properties at terahertz frequencies will be discussed. Results will be shown for a typical dielectric coated aluminum plate specifically designed for low reflection behavior at ? 0.6 terahertz.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. H. Giles "Design and fabrication of narrow band radar absorbing materials at terahertz frequencies", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151426 (1 December 1990); https://doi.org/10.1117/12.2301488
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Cited by 5 scholarly publications.
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KEYWORDS
Dielectrics

Metals

Reflectivity

Radar

Refractive index

Terahertz radiation

Absorption

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