1 December 1990 Precision submillimeter-wave laser reflectometry of metals and superconductors
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 15142S (1990) https://doi.org/10.1117/12.2301510
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The potential for submillimeter-wave laser relative reflectivity measurements with an accuracy of better than 10-4 (corresponding to a potential for relative measurements of surface resistivity with an accuracy better than 10-2 Ohms per square) has been investigated. An experimental arrangement to minimize the effects of changes in laser output and detector drift to levels, necessary to obtain this accuracy has been demonstrated. This was accomplished by simultaneous measurement with a reference detector to reduce short-term fluctuations and rapid sampling to account for longer term drift. Systematic error due to reproducibility of alignment with sample changes limited the present preliminary results to an overall accuracy of approximately 10-2 This achieved level of accuracy is sufficient for measurements of present state-of-the-art thin film high Tc superconductors at 77 K, an example of which is presented here.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. P. Woskov, P. P. Woskov, } "Precision submillimeter-wave laser reflectometry of metals and superconductors", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15142S (1 December 1990); doi: 10.1117/12.2301510; https://doi.org/10.1117/12.2301510
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