1 December 1990 Investigation on crystal defect in semiconductors through infrared and millimeter waves
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151433 (1990) https://doi.org/10.1117/12.2301521
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The microwave cyclotron resonance followed by the far-infrared laser cyclotron resonance has become powerful aid to our understanding of the intrinsic characters of typical semiconductors.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Ohyama, "Investigation on crystal defect in semiconductors through infrared and millimeter waves", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151433 (1 December 1990); doi: 10.1117/12.2301521; https://doi.org/10.1117/12.2301521
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