1 December 1990 Investigation on crystal defect in semiconductors through infrared and millimeter waves
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151433 (1990) https://doi.org/10.1117/12.2301521
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The microwave cyclotron resonance followed by the far-infrared laser cyclotron resonance has become powerful aid to our understanding of the intrinsic characters of typical semiconductors.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Ohyama, T. Ohyama, } "Investigation on crystal defect in semiconductors through infrared and millimeter waves", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151433 (1 December 1990); doi: 10.1117/12.2301521; https://doi.org/10.1117/12.2301521
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