1 December 1990 Effect of finite metallization thickness on radiation characteristics of a dielectric waveguide loaded with periodic strips
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 15143U (1990) https://doi.org/10.1117/12.2301548
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The spectral domain approach is extended to analyzing the radiation of millimeter waves from a dielectric waveguide periodically loaded with thick metallic strips. The formulation views the electric current sheets on the upper and lower surfaces, and inside the strips as the source quantities to be determined so that the original problem is modelled as a multilevel-thin-strips-loaded dielectric waveguide, which, in turn, may be analyzed by the spectral domain approach. The radiation characteristics are demonstrated as a function of the strip thickness. It is shown that there is a significant difference in the leakage constants of TE and TM mode excitations.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aosheng Rong, "Effect of finite metallization thickness on radiation characteristics of a dielectric waveguide loaded with periodic strips", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15143U (1 December 1990); doi: 10.1117/12.2301548; https://doi.org/10.1117/12.2301548
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