1 December 1990 Temperature dependence of dielectric properties of alumina at 20 GHz
Author Affiliations +
Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151440 (1990) https://doi.org/10.1117/12.2301554
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The behaviour of permittivity and loss tangent in the temperature range between 80 to 300 K of several alumina grades is presented. The data are obtained using a resonant cavity technique. The results show smaller temperature dependence for the polycristalline grades, in contrast with the observed behaviour of monocrystalline ones.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Mollá, "Temperature dependence of dielectric properties of alumina at 20 GHz", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151440 (1 December 1990); doi: 10.1117/12.2301554; https://doi.org/10.1117/12.2301554
PROCEEDINGS
3 PAGES


SHARE
RELATED CONTENT


Back to Top