1 December 1990 Temperature dependence of dielectric properties of alumina at 20 GHz
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Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 151440 (1990) https://doi.org/10.1117/12.2301554
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
The behaviour of permittivity and loss tangent in the temperature range between 80 to 300 K of several alumina grades is presented. The data are obtained using a resonant cavity technique. The results show smaller temperature dependence for the polycristalline grades, in contrast with the observed behaviour of monocrystalline ones.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Mollá, J. Mollá, } "Temperature dependence of dielectric properties of alumina at 20 GHz", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 151440 (1 December 1990); doi: 10.1117/12.2301554; https://doi.org/10.1117/12.2301554
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