1 December 1990 Scattering parameter measurements using a three-probe microstrip circuit
Author Affiliations +
Proceedings Volume 1514, 15th International Conference on Infrared and Millimeter Waves; 15146K (1990) https://doi.org/10.1117/12.2301646
Event: 15th International Conference on Infrared and Millimeter Waves, 1990, Orlando, FL, United States
Abstract
A simple, low cost three - probe microstrip circuit has been developed for S - parameter measurements of a two - port network. The results agree very well with those from HP 8510 automatic network analyzer. The design and algorithm can be easily scaled to millimeterwave frequencies.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming-Yi Li, Ming-Yi Li, } "Scattering parameter measurements using a three-probe microstrip circuit", Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15146K (1 December 1990); doi: 10.1117/12.2301646; https://doi.org/10.1117/12.2301646
PROCEEDINGS
3 PAGES


SHARE
RELATED CONTENT

Design of automatic test system software
Proceedings of SPIE (September 02 2003)
A Simple And Low Cost 3 Probe Measurement Technique Using...
Proceedings of SPIE (November 18 1989)
Six-port network analyzer
Proceedings of SPIE (November 13 1998)

Back to Top