Dependence of optical properties of thermal-evaporated lead telluride films on substrate temperature

Weiting Feng; Yixun Yan; Cui Yuan Zhu

doi:10.1117/12.47186

1 November 1991 Dependence of optical properties of thermal-evaporated lead telluride films on substrate temperature

Weiting Feng, Yixun Yan, Cui Yuan Zhu

Proceedings Volume 1519, International Conference on Thin Film Physics and Applications; (1991) https://doi.org/10.1117/12.47186
Event: International Conference on Thin Film Physics and Applications, 1991, Shanghai, China

Abstract

New results on the optical properties of lead telluride films are reported. Semi-transmitting PbTe films were prepared by thermal evaporation. It is demonstrated in detail that substrate temperature during deposition significantly influences the optical properties of PbTe films. The results indicate that PbTe films have the minimum absorption and maximum indices of refraction when deposited at the substrate temperature of 170 degree(s)C and 230 degree(s)C, from wavelengths of 4 to 15 micrometers .

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Weiting Feng, Yixun Yan, and Cui Yuan Zhu "Dependence of optical properties of thermal-evaporated lead telluride films on substrate temperature", Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); https://doi.org/10.1117/12.47186

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KEYWORDS

Refractive index

Optical properties

Absorption

Lead

Physics

Refraction

Temperature metrology

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