Investigation of defects in HgCdTe epi-films grown from Te solutions

Yue Wang; Zhi Jie Tang; Wei Sha Zhuang; Jing Fu He

doi:10.1117/12.47233

1 November 1991 Investigation of defects in HgCdTe epi-films grown from Te solutions

Yue Wang, Zhi Jie Tang, Wei Sha Zhuang, Jing Fu He

Proceedings Volume 1519, International Conference on Thin Film Physics and Applications; (1991) https://doi.org/10.1117/12.47233
Event: International Conference on Thin Film Physics and Applications, 1991, Shanghai, China

Abstract

The defects on MCT epi-films grown from Te Solutions using liquid phase epitaxy method have been investigated by Metaloscope, x-ray diffraction meter, and electronic scanning microscopes. The observation results show that the defects in MCT epi-films, such as dislocation, twin, sub-grain, and boundary, have damaged the crystal-film's lattice structure and led to poor crystal perfection; the stress existed in the film has caused the lattice to deform and further widened the double crystal rocking curve of the film. It has been found that these defects in the MCT films are almost corresponding to that of CdTe substrates; LPE growth procedure and condition can also affect the quality of MCT films.

Citation Download Citation

Yue Wang, Zhi Jie Tang, Wei Sha Zhuang, and Jing Fu He "Investigation of defects in HgCdTe epi-films grown from Te solutions", Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); https://doi.org/10.1117/12.47233

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