Aging characteristics of CdSe thin films at low temperatures

P. J. Sebastian; V. Sivaramakrishnan

doi:10.1117/12.57004

1 February 1992 Aging characteristics of CdSe thin films at low temperatures

P. J. Sebastian, V. Sivaramakrishnan

Proceedings Volume 1523, Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits; (1992) https://doi.org/10.1117/12.57004
Event: Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits, 1992, Madras, India

Abstract

The aging (increase in film resistance with time) of CdSe thin films in oxygen and air at various substrate temperatures are reported. The films aged at low temperatures attained saturation in film resistance faster than those aged at higher substrate temperatures. This may be explained by considering the difference in the oxygen chemisorption rates in various films.

Citation Download Citation

P. J. Sebastian and V. Sivaramakrishnan "Aging characteristics of CdSe thin films at low temperatures", Proc. SPIE 1523, Conference on Physics and Technology of Semiconductor Devices and Integrated Circuits, (1 February 1992); https://doi.org/10.1117/12.57004

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