1 September 1991 High-accuracy edge-matching with an extension of the MPGC-matching algorithm
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Proceedings Volume 1526, Industrial Vision Metrology; (1991) https://doi.org/10.1117/12.48235
Event: Industrial Vision Metrology, 1991, Winnipeg, Canada
Abstract
In industrial dimensional inspection and quality control there is an increasing need for fast and automatic high-accuracy measurement systems. For vision systems to match these requirements all system components have to be tuned carefully. A key role in such a system is played by the measurement algorithm. This paper demonstrates how the area-based multi- photo geometrical constrained (MPGC) matching algorithm can be modified for the highly accurate measurement of object edges. It can be expected that this algorithm allows the measurement of nontargeted but well-defined object features with a relative accuracy of 1:25000.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Armin Gruen, Dirk Stallmann, "High-accuracy edge-matching with an extension of the MPGC-matching algorithm", Proc. SPIE 1526, Industrial Vision Metrology, (1 September 1991); doi: 10.1117/12.48235; https://doi.org/10.1117/12.48235
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