PROCEEDINGS VOLUME 1530
SAN DIEGO, '91 | 21-21 JULY 1991
Optical Scatter: Applications, Measurement, and Theory
Editor(s): John C. Stover
IN THIS VOLUME

5 Sessions, 37 Papers, 0 Presentations
SAN DIEGO, '91
21-21 July 1991
San Diego, CA, United States
Analysis and Theory
Proc. SPIE 1530, Optical scatter: an overview, 0000 (1 December 1991); doi: 10.1117/12.50490
Proc. SPIE 1530, Stokes vectors, Mueller matrices, and polarized scattered light: experimental applications to optical surfaces and all other scatterers, 0000 (1 December 1991); doi: 10.1117/12.50491
Proc. SPIE 1530, Sinusoidal surfaces as standards for BRDF instruments, 0000 (1 December 1991); doi: 10.1117/12.50492
Proc. SPIE 1530, Stray-light implications of scratch/dig specifications, 0000 (1 December 1991); doi: 10.1117/12.50493
Proc. SPIE 1530, Scattering from multilayer coatings: a linear systems model, 0000 (1 December 1991); doi: 10.1117/12.50494
Proc. SPIE 1530, Infrared window damage measured by reflective scatter, 0000 (1 December 1991); doi: 10.1117/12.50495
Proc. SPIE 1530, Backscattering image resolution as a function of particle density, 0000 (1 December 1991); doi: 10.1117/12.50496
Surface Scatter
Proc. SPIE 1530, Coherence in single and multiple scattering of light from randomly rough surfaces, 0000 (1 December 1991); doi: 10.1117/12.50497
Proc. SPIE 1530, Optimal estimation of finish parameters, 0000 (1 December 1991); doi: 10.1117/12.50498
Proc. SPIE 1530, Comparison of low-scatter-mirror PSD derived from multiple-wavelength BRDFs and WYKO profilometer data, 0000 (1 December 1991); doi: 10.1117/12.50499
Proc. SPIE 1530, Scatter and roughness measurements on optical surfaces exposed to space, 0000 (1 December 1991); doi: 10.1117/12.50500
Proc. SPIE 1530, Surface roughness measurements of spherical components, 0000 (1 December 1991); doi: 10.1117/12.50501
Proc. SPIE 1530, Frequency spectrum analysis and assessment of optical surface flaws, 0000 (1 December 1991); doi: 10.1117/12.50502
Scatter from Be Mirrors
Proc. SPIE 1530, Solution for anomalous scattering of bare HIP Be and CVD SiC mirrors, 0000 (1 December 1991); doi: 10.1117/12.50503
Proc. SPIE 1530, Effective surface PSD for bare hot-isostatic-pressed beryllium mirrors, 0000 (1 December 1991); doi: 10.1117/12.50504
Proc. SPIE 1530, Cryoscatter measurements of beryllium, 0000 (1 December 1991); doi: 10.1117/12.50505
Proc. SPIE 1530, Material characterization of beryllium mirrors exhibiting anomalous scatter, 0000 (1 December 1991); doi: 10.1117/12.50506
Proc. SPIE 1530, Scattering from slightly rough crystal surfaces, 0000 (1 December 1991); doi: 10.1117/12.50507
Proc. SPIE 1530, Study of anomalous scatter characteristics, 0000 (1 December 1991); doi: 10.1117/12.50508
Proc. SPIE 1530, Anomalous scattering from optical surfaces with roughness and permittivity perturbations, 0000 (1 December 1991); doi: 10.1117/12.50509
Proc. SPIE 1530, Characterization of hot-isostatic-pressed optical-quality beryllium, 0000 (1 December 1991); doi: 10.1117/12.50510
Proc. SPIE 1530, Beryllium scatter analysis program, 0000 (1 December 1991); doi: 10.1117/12.50511
Instruments and Techniques
Proc. SPIE 1530, Mapping of imbedded contaminants in transparent material by optical scatter, 0000 (1 December 1991); doi: 10.1117/12.50512
Proc. SPIE 1530, Experimental study of the laser retroreflection of various surfaces, 0000 (1 December 1991); doi: 10.1117/12.50513
Proc. SPIE 1530, Design considerations for multipurpose bidirectional reflectometers, 0000 (1 December 1991); doi: 10.1117/12.50514
Proc. SPIE 1530, Helium neon laser optics: scattered light measurements and process control, 0000 (1 December 1991); doi: 10.1117/12.50515
Proc. SPIE 1530, Bidirectional reflectance distribution function raster scan technique for curved samples, 0000 (1 December 1991); doi: 10.1117/12.50516
Proc. SPIE 1530, Description and calibration of a fully automated infrared scatterometer, 0000 (1 December 1991); doi: 10.1117/12.50517
Scatter Measurements
Proc. SPIE 1530, Scatter and contamination of a low-scatter mirror, 0000 (1 December 1991); doi: 10.1117/12.50518
Proc. SPIE 1530, Light scatter variations with respect to wafer orientation in GaAs, 0000 (1 December 1991); doi: 10.1117/12.50519
Proc. SPIE 1530, Stray-light reduction in a WFOV star tracker lens, 0000 (1 December 1991); doi: 10.1117/12.50520
Proc. SPIE 1530, Scattering in paper coatings, 0000 (1 December 1991); doi: 10.1117/12.50521
Proc. SPIE 1530, Infrared BRDF measurements of space shuttle tiles, 0000 (1 December 1991); doi: 10.1117/12.50522
Proc. SPIE 1530, Scattering contribution to the error budget of an emissive IR calibration sphere, 0000 (1 December 1991); doi: 10.1117/12.50523
Proc. SPIE 1530, Light scattering properties of new materials for glazing applications, 0000 (1 December 1991); doi: 10.1117/12.50524
Proc. SPIE 1530, SERS used to study the effect of Langmuir-Blodgett spacer layers on metal surface, 0000 (1 December 1991); doi: 10.1117/12.50525
Instruments and Techniques
Proc. SPIE 1530, Determination of thin-film roughness and volume structure parameters from light-scattering investigations, 0000 (1 December 1991); doi: 10.1117/12.50526
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