1 December 1991 Bidirectional reflectance distribution function raster scan technique for curved samples
Author Affiliations +
Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991); doi: 10.1117/12.50516
Event: San Diego, '91, 1991, San Diego, CA, United States
A measurement technique has been developed for mapping the bidirectional reflectance distribution function (BRDF) over the entire surface of a curved sample at fixed angles of incidence and scatter. The instrument used was the Toomay, Mathis & Associates, Inc., Complete Angle Scatter Instrument at the Optical Characterization Laboratory (OCL) in Oak Ridge, Tennessee. Raster scans and maps of the BRDF of flat samples are relatively straightforward with this instrument, however, similar measurements of curved samples are more complex. The inherent problems involved in performing BRDF mapping on a non-flat optic will be discussed and one solution to those problems will be described for an Optics Manufacturing Operations Development and Integration Laboratories (MODIL) parabolic assessment mirror.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malcolm B. McIntosh, Joseph R. McNeely, "Bidirectional reflectance distribution function raster scan technique for curved samples", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50516; https://doi.org/10.1117/12.50516

Raster graphics

Bidirectional reflectance transmission function



Optics manufacturing

Scatter measurement

Data acquisition


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