Translator Disclaimer
1 December 1991 Cryoscatter measurements of beryllium
Author Affiliations +
Bi-directional Reflection Distribution Function measurements were performed as a function of cryogenic temperature for various substrates. Substrates investigated include HIPed and sputtered beryllium produced from different powders and by various manufacturing and polishing processes. In some samples investigated, the BRDF at 10.6 microns increased by a factor of 2 to 5 during cooling from 300 to 30 Kelvin. On repeated temperature cycling the change in BRDF appeared to be totally elastic. The cryo-scatter effect does not occur for all types of beryllium.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barret Lippey and Wilfried Krone-Schmidt "Cryoscatter measurements of beryllium", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991);


Jet spray cleaning of optics
Proceedings of SPIE (December 18 1992)
In process status of the 1.4 m beryllium semi rigid...
Proceedings of SPIE (December 27 2001)
Scatter and contamination of a low-scatter mirror
Proceedings of SPIE (December 01 1991)
Optimization of a cryogenic mirror stage
Proceedings of SPIE (November 25 2002)
Visible scatter measurements of various materials
Proceedings of SPIE (December 01 1990)
Ultralightweight silicon carbide mirror design
Proceedings of SPIE (November 11 1996)

Back to Top