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1 December 1991 Cryoscatter measurements of beryllium
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Abstract
Bi-directional Reflection Distribution Function measurements were performed as a function of cryogenic temperature for various substrates. Substrates investigated include HIPed and sputtered beryllium produced from different powders and by various manufacturing and polishing processes. In some samples investigated, the BRDF at 10.6 microns increased by a factor of 2 to 5 during cooling from 300 to 30 Kelvin. On repeated temperature cycling the change in BRDF appeared to be totally elastic. The cryo-scatter effect does not occur for all types of beryllium.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Barret Lippey and Wilfried Krone-Schmidt "Cryoscatter measurements of beryllium", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50505
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