Cryoscatter measurements of beryllium

Barret Lippey; Wilfried Krone-Schmidt

doi:10.1117/12.50505

1 December 1991 Cryoscatter measurements of beryllium

Barret Lippey; Wilfried Krone-Schmidt

Author Affiliations +

Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991) https://doi.org/10.1117/12.50505
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Bi-directional Reflection Distribution Function measurements were performed as a function of cryogenic temperature for various substrates. Substrates investigated include HIPed and sputtered beryllium produced from different powders and by various manufacturing and polishing processes. In some samples investigated, the BRDF at 10.6 microns increased by a factor of 2 to 5 during cooling from 300 to 30 Kelvin. On repeated temperature cycling the change in BRDF appeared to be totally elastic. The cryo-scatter effect does not occur for all types of beryllium.

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Barret Lippey, Barret Lippey, Wilfried Krone-Schmidt, Wilfried Krone-Schmidt, } "Cryoscatter measurements of beryllium", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50505; https://doi.org/10.1117/12.50505

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