Scatter and contamination of a low-scatter mirror

Joseph R. McNeely; Malcolm B. McIntosh; M. Alfred Akerman

doi:10.1117/12.50518

1 December 1991 Scatter and contamination of a low-scatter mirror

Joseph R. McNeely, Malcolm B. McIntosh, M. Alfred Akerman

Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991) https://doi.org/10.1117/12.50518
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The contamination of high-quality, space-borne optics by particles originating from baffle systems could significantly alter the performance of the optics. To assess this potential problem, the bidirectional reflectance distribution function (BRDF) of a low-scatter beryllium mirror was measured at the 10.6-micron wavelength with the mirror in the 'cleaned' state and after controlled contaminations with aluminum oxide powder up to 100 microns in size. The aluminum oxide powder was used to simulate particles which could be released from a typical baffle material. After contamination, the particle size distribution on the mirror surface was statistically sampled using a scanning electron microscope image analysis technique. The BRDF measurements of the contaminated mirror were compared to Mie scattering theory calculations for subwavelength, wavelength, and superwavelength particles sizes.

Citation Download Citation

Joseph R. McNeely, Malcolm B. McIntosh, and M. Alfred Akerman "Scatter and contamination of a low-scatter mirror", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50518

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
11 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Particles

Mirrors

Bidirectional reflectance transmission function

Contamination

Mie scattering

Scanning electron microscopy

Scattering

Show All Keywords

Keywords/Phrases

Search In:

Publication Years