1 December 1991 Scatter and contamination of a low-scatter mirror
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Abstract
The contamination of high-quality, space-borne optics by particles originating from baffle systems could significantly alter the performance of the optics. To assess this potential problem, the bidirectional reflectance distribution function (BRDF) of a low-scatter beryllium mirror was measured at the 10.6-micron wavelength with the mirror in the 'cleaned' state and after controlled contaminations with aluminum oxide powder up to 100 microns in size. The aluminum oxide powder was used to simulate particles which could be released from a typical baffle material. After contamination, the particle size distribution on the mirror surface was statistically sampled using a scanning electron microscope image analysis technique. The BRDF measurements of the contaminated mirror were compared to Mie scattering theory calculations for subwavelength, wavelength, and superwavelength particles sizes.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph R. McNeely, Joseph R. McNeely, Malcolm B. McIntosh, Malcolm B. McIntosh, M. Alfred Akerman, M. Alfred Akerman, } "Scatter and contamination of a low-scatter mirror", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50518; https://doi.org/10.1117/12.50518
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