1 December 1991 Sinusoidal surfaces as standards for BRDF instruments
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Abstract
This study of light scattered by sinusoidal surfaces shows that such a configuration can be used as a material standard to help calibrate instruments that measure the BRDF of arbitrary surfaces. Measured and computed values of the power scattered into the diffraction peaks show good agreement, and such calculations can be further improved and used to verify the standards.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Egon Marx, Egon Marx, Thomas Robert Lettieri, Thomas Robert Lettieri, Theodore V. Vorburger, Theodore V. Vorburger, Malcolm B. McIntosh, Malcolm B. McIntosh, } "Sinusoidal surfaces as standards for BRDF instruments", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); doi: 10.1117/12.50492; https://doi.org/10.1117/12.50492
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