PROCEEDINGS VOLUME 1531
SAN DIEGO, '91 | 21-21 JULY 1991
Advanced Optical Manufacturing and Testing II
IN THIS VOLUME

5 Sessions, 35 Papers, 0 Presentations
SAN DIEGO, '91
21-21 July 1991
San Diego, CA, United States
Advanced Testing I
Proc. SPIE 1531, Integrated end-to-end metrology and data analysis system for the advanced x-ray astrophysics facility telescope mirrors, 0000 (1 January 1992); doi: 10.1117/12.134842
Proc. SPIE 1531, Optical design and testing of a fast large-aperture infrared space telescope, 0000 (1 January 1992); doi: 10.1117/12.134843
Proc. SPIE 1531, New optical testing methods developed at the University of Hawaii: results on ground-based telescopes and Hubble Space Telescope, 0000 (1 January 1992); doi: 10.1117/12.134844
Proc. SPIE 1531, Hartmann interferometric testing of large mirrors, 0000 (1 January 1992); doi: 10.1117/12.134845
Proc. SPIE 1531, Convenient noncontact radius measurement using secondary moire properties, 0000 (1 January 1992); doi: 10.1117/12.134846
Proc. SPIE 1531, Lambda-over-one-thousand metrology results for steep aspheres using a curvature profiling technique, 0000 (1 January 1992); doi: 10.1117/12.134847
Proc. SPIE 1531, Noninterferometric noncontact device for lambda-over-one-hundred metrology of large aspheres during grinding and polishing, 0000 (1 January 1992); doi: 10.1117/12.134848
Proc. SPIE 1531, Development of the toroidal surface measuring system, 0000 (1 January 1992); doi: 10.1117/12.134849
Advanced Testing II
Proc. SPIE 1531, Microlens array analysis using image processing techniques, 0000 (1 January 1992); doi: 10.1117/12.134850
Proc. SPIE 1531, Precision evaluation of lens systems using a nodal slide/MTF optical bench, 0000 (1 January 1992); doi: 10.1117/12.134851
Proc. SPIE 1531, Simultaneous phase-shift interferometer, 0000 (1 January 1992); doi: 10.1117/12.134852
Proc. SPIE 1531, Profile measurement of concave mirror by a common-path interferometer on ultraprecision machine, 0000 (1 January 1992); doi: 10.1117/12.134853
Proc. SPIE 1531, Design, fabrication, and application of diamond-machined null lenses for testing generalized aspheric surfaces, 0000 (1 January 1992); doi: 10.1117/12.134854
Proc. SPIE 1531, Novel technique for aligning paraboloids, 0000 (1 January 1992); doi: 10.1117/12.134855
Proc. SPIE 1531, Automatic interferometric evaluation of tool decentration for diamond-turned optics, 0000 (1 January 1992); doi: 10.1117/12.134856
Proc. SPIE 1531, Testing stress birefringence of an optical window, 0000 (1 January 1992); doi: 10.1117/12.134857
Advanced Manufacturing I
Proc. SPIE 1531, Technology development at the Center for Optics Manufacturing, 0000 (1 January 1992); doi: 10.1117/12.134858
Proc. SPIE 1531, Leveraging costs and reducing risk in the development of optics manufacturing technological thrusts, 0000 (1 January 1992); doi: 10.1117/12.134859
Proc. SPIE 1531, Process science development at the Center for Optics Manufacturing, 0000 (1 January 1992); doi: 10.1117/12.134860
Proc. SPIE 1531, Computer-integrated manufacturing system for OPTICAM, 0000 (1 January 1992); doi: 10.1117/12.134861
Proc. SPIE 1531, Surface error correction of a Keck 10-m telescope primary mirror segment by ion figuring, 0000 (1 January 1992); doi: 10.1117/12.134862
Proc. SPIE 1531, Approximation methods and the computer numerically controlled fabrication of optical surfaces, 0000 (1 January 1992); doi: 10.1117/12.134863
Proc. SPIE 1531, OPTICAM machine design, 0000 (1 January 1992); doi: 10.1117/12.134864
Advanced Manufacturing II
Proc. SPIE 1531, Comparison of optical and mechanical measurements of surface finish, 0000 (1 January 1992); doi: 10.1117/12.134865
Proc. SPIE 1531, Spatial frequency response for an optical profiler, 0000 (1 January 1992); doi: 10.1117/12.134866
Proc. SPIE 1531, Stressed-lap polishing of 3.5-m f/1.5 and 1.8-m f/1.0 mirrors, 0000 (1 January 1992); doi: 10.1117/12.134867
Proc. SPIE 1531, Inexpensive method to evaluate and optimize spot tool performance for the small optical shop, 0000 (1 January 1992); doi: 10.1117/12.134868
Proc. SPIE 1531, High degree of accuracy in flatness and parallelism of thin sapphire ring manufacture with double-sided lapping, 0000 (1 January 1992); doi: 10.1117/12.134869
Standby Papers
Proc. SPIE 1531, Birefringent common-path interferometer for testing large convex spherical surfaces, 0000 (1 January 1992); doi: 10.1117/12.134870
Advanced Manufacturing II
Proc. SPIE 1531, MTF measurement for testing microscopic objective, 0000 (1 January 1992); doi: 10.1117/12.134871
Proc. SPIE 1531, Optical measurements of reflectance and absorptance of metals, 0000 (1 January 1992); doi: 10.1117/12.134872
Standby Papers
Proc. SPIE 1531, Method for eliminating the system errors in aspheric surfaces test by using computer-generated holograms, 0000 (1 January 1992); doi: 10.1117/12.134873
Proc. SPIE 1531, Computer simulation of loose abrasive grinding aspherical optical surface by local figuring pitch (Proceedings Only), 0000 (1 January 1992); doi: 10.1117/12.134874
Advanced Manufacturing I
Proc. SPIE 1531, Polarization compensation during circumferential metrology of advanced x-ray astrophysical facility optics, 0000 (1 January 1992); doi: 10.1117/12.134875
Advanced Testing I
Proc. SPIE 1531, Removal rates of fused silica with cerium oxide/pitch polishing, 0000 (1 January 1992); doi: 10.1117/12.134876
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