MTF measurement for testing microscopic objective

Changyuan Han; Bin Liu; Xue-Fen Chi; Wei Li

doi:10.1117/12.134871

1 January 1992 MTF measurement for testing microscopic objective

Changyuan Han, Bin Liu, Xue-Fen Chi, Wei Li

Proceedings Volume 1531, Advanced Optical Manufacturing and Testing II; (1992) https://doi.org/10.1117/12.134871
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

This paper describes a method for measuring MTF of microscope objective, especially high- power oil-immersion microscope objective. The spatial frequency that can be measured is up to 4000 c/mm. The measurement principle, apparatus construction, and measurement results are presented. The results show that the apparatus can be applied to the image evaluation and quality test of microscope objective.

Citation Download Citation

Changyuan Han, Bin Liu, Xue-Fen Chi, and Wei Li "MTF measurement for testing microscopic objective", Proc. SPIE 1531, Advanced Optical Manufacturing and Testing II, (1 January 1992); https://doi.org/10.1117/12.134871

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available