1 December 1991 High-bandwidth alignment sensing in active optical systems
Author Affiliations +
Active optical system approaches offer the possibility of designing large, spaceborne optical systems that weigh considerably less than conventional passive designs. They offer the further possibility of active compensation for on-orbit thermal and mechanical disturbances. However, a key enabling technology is the ability to accurately and rapidly sense optical system misalignments and figure errors. This paper describes the sample point interferometer (SPI), a measurement technique that can meet the sensing requirements of active optical systems. By monitoring the optical path lengths of an array of pencil beams projected to a corresponding array of retroreflectors affixed to the mirror, the SPI can provide simultaneous measurements of rigid body alignment and figure. The SPI uses semiconductor laser diodes as a light source for two-wavelength interferometry, and provides alignment and figure measurements that are repeatable, have a large dynamic range, and can be acquired at high bandwidths.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stanley J. Kishner, Stanley J. Kishner, } "High-bandwidth alignment sensing in active optical systems", Proc. SPIE 1532, Analysis of Optical Structures, (1 December 1991); doi: 10.1117/12.48267; https://doi.org/10.1117/12.48267


VCSELs for interferometric readout of MEMS sensors
Proceedings of SPIE (March 17 2016)
A High-Resolution Laser Scale Interferometer
Proceedings of SPIE (December 11 1984)
Infrared MEMS-based Lamellar grating spectrometer
Proceedings of SPIE (August 15 2004)
Defocus grating systems for optical alignment
Proceedings of SPIE (October 19 2004)

Back to Top