1 November 1991 Cryogenic refractive indices of cadmium telluride coatings in wavelength range from 2.5 to 20 μm
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Proceedings Volume 1535, Passive Materials for Optical Elements; (1991); doi: 10.1117/12.48319
Event: San Diego, '91, 1991, San Diego, CA, United States
Abstract
A sample of cadmium telluride coating was formed onto a germanium substrate by thermal evaporation. The optical constants were measured by a modification of the envelope method in which only data from transmission spectrum are used and the procedure is simple. Accuracies are about one part in the third decimal place with the technique. The sample was mounted in a vacuum chamber and its optical constants were measured as a function of wavelength, from 2.5 - 20micrometers , at four fixed temperatures. Results in the form of refractive index versus temperature and wavelength are presented, as well as values of dn/dT as a function of wavelength and temperature.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weiting Feng, Yixun Yen, Cui Yuan Zhu, "Cryogenic refractive indices of cadmium telluride coatings in wavelength range from 2.5 to 20 μm", Proc. SPIE 1535, Passive Materials for Optical Elements, (1 November 1991); doi: 10.1117/12.48319; https://doi.org/10.1117/12.48319
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KEYWORDS
Refractive index

Cadmium

Temperature metrology

Optical testing

Transmittance

Cryogenics

Thin films

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