1 November 1991 Refractive-index measurement using moiré deflectometry: working conditions
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Abstract
An analysis of the parameters that limit the accuracy of moire deflectometry as a refractometry technique is made.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Diana Tentori, Diana Tentori, C. Lopez Famozo, C. Lopez Famozo, "Refractive-index measurement using moiré deflectometry: working conditions", Proc. SPIE 1535, Passive Materials for Optical Elements, (1 November 1991); doi: 10.1117/12.48317; https://doi.org/10.1117/12.48317
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