Refractive-index measurement using moire deflectometry: working conditions

Diana Tentori; C. Lopez Famozo

doi:10.1117/12.48317

1 November 1991 Refractive-index measurement using moiré deflectometry: working conditions

Diana Tentori, C. Lopez Famozo

Proceedings Volume 1535, Passive Materials for Optical Elements; (1991) https://doi.org/10.1117/12.48317
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

An analysis of the parameters that limit the accuracy of moire deflectometry as a refractometry technique is made.

Citation Download Citation

Diana Tentori and C. Lopez Famozo "Refractive-index measurement using moiré deflectometry: working conditions", Proc. SPIE 1535, Passive Materials for Optical Elements, (1 November 1991); https://doi.org/10.1117/12.48317

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