1 January 1992 Development of hard x-ray optics
Author Affiliations +
Proceedings Volume 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics; (1992); doi: 10.1117/12.51248
Event: San Diego, '91, 1991, San Diego, CA, United States
Studies of cosmic X-ray sources have suffered from lack of focussing optics in the hard X-ray spectral region (E above 10 keV); in the absence of imaging optics, celestial X-rays are masked by the cosmic ray background, which severely degrades the detector sensitivity. There are several possible ways to develop grazing incidence imaging optics for this spectral region; we describe here one approach which utilizes numerous large diameter silicon wafers to form a flat-plate imaging telescope. A prototype imager of this type has been constructed, and we present measurements of surface quality, coalignment accuracy, and imaging ability.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marshall K. Joy, Martin C. Weisskopf, "Development of hard x-ray optics", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51248; https://doi.org/10.1117/12.51248


X-ray optics


Hard x-rays

Semiconducting wafers

Grazing incidence

Wafer-level optics


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