1 January 1992 Soft x-ray ion chamber
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Abstract
The technique of soft x-ray ion chamber includes the measurement of the ion current as a function of rare gas pressure in the ion chamber. The true photoionization current, and hence absolute photon flux, is obtained by extrapolating ion current to zero gas pressure. This paper describes measurement of the absolute photon flux at He II 25.6 nm and CK(alpha) 4.47 nm.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bo Chen, Bo Chen, Ling Ma, Ling Ma, Futian Li, Futian Li, Xingdan Chen, Xingdan Chen, } "Soft x-ray ion chamber", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51245; https://doi.org/10.1117/12.51245
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