X-ray scattering measurements from thin-foil x-ray mirrors

Finn Erland Christensen; B. P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Niels J. Westergaard; Herbert W. Schnopper; Lalit Jalota

doi:10.1117/12.51225

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1 January 1992 X-ray scattering measurements from thin-foil x-ray mirrors

Finn Erland Christensen, B. P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, Niels J. Westergaard, Herbert W. Schnopper, Lalit Jalota

Author Affiliations +

Proceedings Volume 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics; (1992) https://doi.org/10.1117/12.51225
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Thin foil X-ray mirrors are to be used as the reflecting elements in the telescopes of the X-ray satellites Spectrum-X-Gamma (SRG) and ASTRO-D. High resolution X-ray scattering measurements from the Au coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The X-ray data is compared with laser data and other surface structure data such as STM, atomic force microscopy (AFM), TEM, and electron micrography. The data obtained at Cu K-alpha(1), (8.05 keV) from all the mirrors produced on Al foils shows a scatter which limits the obtainable half-power width to above 1.5 arcmin. Mirrors based on electroformed Ni foils, however, show local regions with a factor of 4 better performance, and they are being developed for future applications.

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Finn Erland Christensen, B. P. Byrnak, Allan Hornstrup, Shou-Hua Zhu, Niels J. Westergaard, Herbert W. Schnopper, and Lalit Jalota "X-ray scattering measurements from thin-foil x-ray mirrors", Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); https://doi.org/10.1117/12.51225

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