Soft x-ray resonant magnetic scattering study of thin films and multilayers

Chi-Chang Kao; Erik D. Johnson; Jerome B. Hastings; D. Peter Siddons; Christian Vettier

doi:10.1117/12.50580

1 November 1991 Soft x-ray resonant magnetic scattering study of thin films and multilayers

Chi-Chang Kao, Erik D. Johnson, Jerome B. Hastings, D. Peter Siddons, Christian Vettier

Proceedings Volume 1548, Production and Analysis of Polarized X Rays; (1991) https://doi.org/10.1117/12.50580
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

A brief review of using soft x-ray resonant magnetic scattering in the study of magnetic thin films and multilayers is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information that can be obtained and the unique features of this technique. Comparison is made with related techniques: magneto- optical Kerr effect, Faraday effect, and magnetic circular dichroism.

Citation Download Citation

Chi-Chang Kao, Erik D. Johnson, Jerome B. Hastings, D. Peter Siddons, and Christian Vettier "Soft x-ray resonant magnetic scattering study of thin films and multilayers", Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); https://doi.org/10.1117/12.50580

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available