1 November 1991 Soft x-ray resonant magnetic scattering study of thin films and multilayers
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Abstract
A brief review of using soft x-ray resonant magnetic scattering in the study of magnetic thin films and multilayers is given. Results from recent studies of thin Fe films and Fe/Gd multilayers are used as examples to demonstrate the information that can be obtained and the unique features of this technique. Comparison is made with related techniques: magneto- optical Kerr effect, Faraday effect, and magnetic circular dichroism.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chi-Chang Kao, Chi-Chang Kao, Erik D. Johnson, Erik D. Johnson, Jerome B. Hastings, Jerome B. Hastings, D. Peter Siddons, D. Peter Siddons, Christian Vettier, Christian Vettier, } "Soft x-ray resonant magnetic scattering study of thin films and multilayers", Proc. SPIE 1548, Production and Analysis of Polarized X Rays, (1 November 1991); doi: 10.1117/12.50580; https://doi.org/10.1117/12.50580
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