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1 October 1991 Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements
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Abstract
Hard x-ray reflectivity measurements of mosaic crystals are being performed at the x-ray facility of the physics department of the University of Ferrara. This paper reports on preliminary results obtained by using flat samples of pyrolytic graphite (002) with a thickness of 2 mm and a mosaic spread of 0.3 deg. A short description is given of the experimental apparatus and calibration procedures followed.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Filippo Frontera, Paola De Chiara, Mauro Gambaccini, Gianni Landini, and G. Pasqualini "Hard x-ray imaging via crystal diffraction: first results of reflectivity measurements", Proc. SPIE 1549, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (1 October 1991); https://doi.org/10.1117/12.48332
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