Translator Disclaimer
1 November 1991 Combined x-ray absorption spectroscopy and x-ray powder diffraction
Author Affiliations +
The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure while XRD detects the long-range crystallinity enabling the heterogeneity of materials like single-phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed-oxide catalysts.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew J. Dent, Gareth E. Derbyshire, G. Neville Greaves, Christine A. Ramsdale, J. W. Couves, Richard Jones, C. Richard A. Catlow, and John M. Thomas "Combined x-ray absorption spectroscopy and x-ray powder diffraction", Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991);

Back to Top