1 November 1991 Model-based flaw reconstruction using limited-view x-ray projections and flawless prototype image
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Abstract
A new flaw reconstruction scheme is proposed for locating and sizing flaws embedded in materials as well as estimating their absorption coefficients in an unified manner. Based on x- ray projections and flawless prototype tomogram, the proposed method locates flaws by detecting their convex hulls, fits elliptic models into the convex hulls with identical moments of inertia, and estimates flaws' absorption coefficients using least-squares principle. Due to the capability of annihilating false-alarm flaws, the proposed method improves the detection performance of the convex hull method. For convex type of flaws, simulation results show that the proposed method can produce very accurate estimates of flaw intensity as well as flaw size and orientation for full-view and limited-view noiseless cases.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hsien-Sen Hung, Hsien-Sen Hung, Mete Eray, Mete Eray, } "Model-based flaw reconstruction using limited-view x-ray projections and flawless prototype image", Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); doi: 10.1117/12.49465; https://doi.org/10.1117/12.49465
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