5 February 1992 High-resolution XUV spectroscopy of x-ray laser plasmas
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This paper discusses recent progress in LLNL's high resolution XUV spectroscopy efforts with x-ray laser plasmas. We describe the instrumentation used, and we present preliminary time-resolved data on the spectral profiles of several XUV (extreme ultraviolet) lines from Ne- like Se and Ne-like Y x-ray lasers which have been obtained with instrumental resolutions ((lambda) /(Delta) (lambda) ) of approximately 10,000. The Se data indicates that the 206.4 angstroms J equals 2 - 1 laser line narrows below the expected 400 eV Doppler width (35 m angstroms) when amplified through approximately 6 gain lengths, while the Y data shows no evidence of the J equals 0 - 1 laser predicted to be nearly resonant with the J equals 2 - 1 laser at 154.9 angstroms.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jeffrey A. Koch, Jeffrey A. Koch, Phillip J. Batson, Phillip J. Batson, Michael R. Carter, Michael R. Carter, Karen L. Chapman, Karen L. Chapman, Luiz Barroca Da Silva, Luiz Barroca Da Silva, Brian J. MacGowan, Brian J. MacGowan, Dennis L. Matthews, Dennis L. Matthews, Stanley Mrowka, Stanley Mrowka, James H. Scofield, James H. Scofield, Gregory M. Shimkaveg, Gregory M. Shimkaveg, James H. Underwood, James H. Underwood, Rosemary S. Walling, Rosemary S. Walling, "High-resolution XUV spectroscopy of x-ray laser plasmas", Proc. SPIE 1551, Ultrashort Wavelength Lasers, (5 February 1992); doi: 10.1117/12.134815; https://doi.org/10.1117/12.134815

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