1 January 1992 White light interferometer for measuring polarization extinction ratio
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Abstract
A white light interferometer was developed for measuring polarization extinction ratios in proton-exchanged, integrated-optic (IO) chips. Usually, such measurements require expensive strain-free polarization components. The instrument which was developed at United Technologies Research Center measured extinction ratios in excess of 95 dB using only interferometric quality optics. The system used a superluminescent diode operating at 825 nanometers as the illumination source and two interferometers combined in series, a measurement interferometer and an analyzing interferometer. The measurement interferometer relied upon the two axes of polarization in the IO chip having different optical pathlengths and the analyzing interferometer was a modified Mach-Zehnder. Results using this system on the IO chips showed that the extinction ratio was 58 dB.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James P. Waters, James P. Waters, Daniel J. Fritz, Daniel J. Fritz, } "White light interferometer for measuring polarization extinction ratio", Proc. SPIE 1553, Laser Interferometry IV: Computer-Aided Interferometry, (1 January 1992); doi: 10.1117/12.135287; https://doi.org/10.1117/12.135287
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