PROCEEDINGS VOLUME 1554
SAN DIEGO, '91 | 21-21 JULY 1991
Second International Conference on Photomechanics and Speckle Metrology
SAN DIEGO, '91
21-21 July 1991
San Diego, CA, United States
Stress Analysis and Fracture I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 48 (1 December 1991); doi: 10.1117/12.49479
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 60 (1 December 1991); doi: 10.1117/12.49480
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Stress Analysis and Fracture II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 102 (1 December 1991); doi: 10.1117/12.49484
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 116 (1 December 1991); doi: 10.1117/12.49485
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Stress Analysis and Fracture III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 164 (1 December 1991); doi: 10.1117/12.49504
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 176 (1 December 1991); doi: 10.1117/12.49513
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Stress Analysis and Fracture IV
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 240 (1 December 1991); doi: 10.1117/12.49544
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Birefringence Methods I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 297 (1 December 1991); doi: 10.1117/12.49549
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 313 (1 December 1991); doi: 10.1117/12.49550
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 323 (1 December 1991); doi: 10.1117/12.49552
Birefringence Methods II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 332 (1 December 1991); doi: 10.1117/12.49553
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 341 (1 December 1991); doi: 10.1117/12.49554
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 380 (1 December 1991); doi: 10.1117/12.49558
Birefringence Methods III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 418 (1 December 1991); doi: 10.1117/12.49559
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 388 (1 December 1991); doi: 10.1117/12.49560
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 407 (1 December 1991); doi: 10.1117/12.49563
Birefringence Methods V
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 482 (1 December 1991); doi: 10.1117/12.49564
Birefringence Methods IV
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 434 (1 December 1991); doi: 10.1117/12.49565
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Birefringence Methods V
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 458 (1 December 1991); doi: 10.1117/12.49568
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 488 (1 December 1991); doi: 10.1117/12.49569
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New Techniques and Applications I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 512 (1 December 1991); doi: 10.1117/12.49573
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 547 (1 December 1991); doi: 10.1117/12.49490
New Techniques and Applications II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 579 (1 December 1991); doi: 10.1117/12.49491
New Techniques and Applications I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 553 (1 December 1991); doi: 10.1117/12.49492
New Techniques and Applications II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 558 (1 December 1991); doi: 10.1117/12.49493
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 570 (1 December 1991); doi: 10.1117/12.49494
Stress Analysis and Fracture III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 209 (1 December 1991); doi: 10.1117/12.49497
Speckle Photography and Interferometry I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 588 (1 December 1991); doi: 10.1117/12.49498
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 610 (1 December 1991); doi: 10.1117/12.49501
Speckle Photography and Interferometry IV
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 747 (1 December 1991); doi: 10.1117/12.49502
Speckle Photography and Interferometry I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 613 (1 December 1991); doi: 10.1117/12.49503
Speckle Photography and Interferometry II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 620 (1 December 1991); doi: 10.1117/12.49505
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 628 (1 December 1991); doi: 10.1117/12.49506
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Speckle Photography and Interferometry III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 660 (1 December 1991); doi: 10.1117/12.49511
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 668 (1 December 1991); doi: 10.1117/12.49512
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Speckle Photography and Interferometry IV
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 706 (1 December 1991); doi: 10.1117/12.49517
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 718 (1 December 1991); doi: 10.1117/12.49518
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Speckle Photography and Interferometry V
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 756 (1 December 1991); doi: 10.1117/12.49525
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Optical Caustic Methods
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 802 (1 December 1991); doi: 10.1117/12.49531
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Digital Optical Analysis I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 862 (1 December 1991); doi: 10.1117/12.49536
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Digital Optical Analysis II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 898 (1 December 1991); doi: 10.1117/12.49539
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Digital Optical Analysis I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 886 (1 December 1991); doi: 10.1117/12.49542
Digital Optical Analysis II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 922 (1 December 1991); doi: 10.1117/12.49543
Plenary Session
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 2 (1 December 1991); doi: 10.1117/12.49575
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 29 (1 December 1991); doi: 10.1117/12.49576
Holographic Interferometry I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 47 (1 December 1991); doi: 10.1117/12.57452
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 56 (1 December 1991); doi: 10.1117/12.57453
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 81 (1 December 1991); doi: 10.1117/12.57474
Optical Nondestructive Testing III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 790 (1 December 1991); doi: 10.1117/12.57475
Holographic Interferometry II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 92 (1 December 1991); doi: 10.1117/12.57476
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 106 (1 December 1991); doi: 10.1117/12.57478
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 119 (1 December 1991); doi: 10.1117/12.57480
Holographic Interferometry III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 128 (1 December 1991); doi: 10.1117/12.57481
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 135 (1 December 1991); doi: 10.1117/12.57482
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Grating and Moire Methods I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 162 (1 December 1991); doi: 10.1117/12.57486
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Grating and Moire Methods II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 202 (1 December 1991); doi: 10.1117/12.57489
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 210 (1 December 1991); doi: 10.1117/12.57490
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Grating and Moire Methods III
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 248 (1 December 1991); doi: 10.1117/12.57494
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Grating and Moire Methods I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 188 (1 December 1991); doi: 10.1117/12.57498
Grating and Moire Methods IV
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 282 (1 December 1991); doi: 10.1117/12.57499
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Grating and Moire Methods I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 193 (1 December 1991); doi: 10.1117/12.57502
Moire Interferometry I
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 304 (1 December 1991); doi: 10.1117/12.57413
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Moire Interferometry II
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 344 (1 December 1991); doi: 10.1117/12.57419
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, pg 357 (1 December 1991); doi: 10.1117/12.57420
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