1 December 1991 Electronic shearography versus ESPI in nondestructive evaluation
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This paper will give a review of two major optical methods of nondestructive testing: ESPI and electronic shearography. A comparison of the two techniques is also presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y.Y. Hung, "Electronic shearography versus ESPI in nondestructive evaluation", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57459; https://doi.org/10.1117/12.57459

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