Electronic shearography versus ESPI in nondestructive evaluation

Y.Y. Hung

doi:10.1117/12.57459

1 December 1991 Electronic shearography versus ESPI in nondestructive evaluation

Y.Y. Hung

Author Affiliations +

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.57459
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

This paper will give a review of two major optical methods of nondestructive testing: ESPI and electronic shearography. A comparison of the two techniques is also presented.

Citation Download Citation

Y.Y. Hung "Electronic shearography versus ESPI in nondestructive evaluation", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57459

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