Translator Disclaimer
1 December 1991 High-resolution computer-aided moiré
Author Affiliations +
Abstract
This paper presents a high resolution computer assisted moiré technique for the measurement of displacements and strains at the microscopic level. The detection of micro-displacements using a moiré grid and the problem associated with the recovery of displacement field from the sampled values of the grid intensity are discussed. A two dimensional Fourier transform method for the extraction of displacements from the image of the moiré grid is outlined. An example of application of the technique to the measurement of strains and stresses in the vicinity of the crack tip in a compact tension specimen is given.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cesar A. Sciammarella and Gopalakrishna K. Bhat "High-resolution computer-aided moiré", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.57486
PROCEEDINGS
PAGES


SHARE
Advertisement
Advertisement
Back to Top