1 December 1991 Influence of fixing stress on the sensitivity of HNDT
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Abstract
Holographic Nondestructive Testing ( HNDT ) has a considerable potential for nondestructive inspection of laminated structure, composite structure and so on. The key of HNDT is stressing on the specimen in such a manner so as to distinguish the anomalous area from the normal area by displacement or deformation. In this paper, the principle of HNDT employed thermal stressing has been further studied. The influence of the stress caused by fixing device on the sensitivity of HNDT is proposed and verified experimentally. Experiments show that it is difficult to evaluate the anomalous area from the good area when the stress caused by fixing device is tensile stress. Clearly, the results of this paper can be served as the scientific basis for designing the fixture which examine above mentioned structures for flaw or defect.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Xiao Yang, Yu Xiao Yang, Yushan Tan, Yushan Tan, } "Influence of fixing stress on the sensitivity of HNDT", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57468; https://doi.org/10.1117/12.57468
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