1 December 1991 Moiré topography with the aid of phase-shift method
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Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991); doi: 10.1117/12.57429
Event: San Diego, '91, 1991, San Diego, CA, United States
Abstract
Moiré topography has been utilized as a practical method for three-dimensional measurement in various industrial and medical fields. However, such shortcomings inherent to conventional moiré topography as low resolution and difficulties in computation are indicated. This means that the measuring points are restricted to points on the contours and that identification of convex or convex of the surface shape is impossible using one moiré picture. These problems are expected to be overcome by phase shift method.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toru Yoshizawa, Teiyu Tomisawa, "Moiré topography with the aid of phase-shift method", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57429; https://doi.org/10.1117/12.57429
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Moire patterns

Phase shifts

Light sources

Mechanics

Holographic interferometry

Aluminum

CCD cameras

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